Chemical-mechanical planarization

Results: 22



#Item
1Semiconductor device fabrication / Copper interconnect / Chemical-mechanical planarization / Plating / GlobalFoundries / Wafer / Back end of line / Fraunhofer Society / Copper plating / Silicon Saxony

FRAUNHOFER INSTITUTE FOR PHOTONIC MICROSYSTEMS IPMS CENTER NANOELECTRONIC TECHNOLOGIES (CNT) INTERCONNECTS HIGH-K DEVICES

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Source URL: www.ipms.fraunhofer.de

Language: English - Date: 2016-04-01 03:01:20
2Semiconductor device fabrication / Microtechnology / Acoustic microscopy / Wafer / Void / Chemical-mechanical planarization / Microfabrication / Microelectromechanical systems / Megasonic cleaning / Photolithography / Etching

Management of Voids in Processing of Bonded Wafers Dr. Shari Farrens, Chief Scientist, EV Group Inc. Dr. Lawrence W. Kessler, President, Sonoscan, Inc. Abstract This paper discusses the origination and detection of bondi

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Source URL: www.sonoscan.com

Language: English - Date: 2016-07-20 11:09:32
3Semiconductor device fabrication / Copper interconnect / Chemical-mechanical planarization / Plating / Wafer / GlobalFoundries / Back end of line / Fraunhofer Society

FRAUNHOFER INSTITUTE FOR PHOTONIC MICROSYSTEMS IPMS CENTER NANOELECTRONIC TECHNOLOGIES (CNT) 2 1

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Source URL: www.screening-fab.com

Language: English - Date: 2016-02-10 06:01:49
4Microtechnology / Visual arts / Metalworking / Etching / Polishing / Flatness / Wafer / Metrology / Chemical-mechanical planarization / Semiconductor device fabrication / Technology / Materials science

FRAUNHOFER-INSTITUT FÜR I nte g rierte S y steme un d B aue l ementete c hno l o g ie I I S B Towards 450 mm

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Source URL: www.iisb.fraunhofer.de

Language: English - Date: 2015-06-10 03:01:05
5Chemical-mechanical planarization / Science / Park Systems / Wafer / Profilometer / Atomic force microscopy / 1 micrometre / Semiconductor device fabrication / Technology / Materials science

Chemical Mechanical Polishing (CMP) Metrology with Advanced Surface Profiler >>> Figure 1. The key matrices of metal chemical mechanical

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
6American Society for Engineering Education / ASME / Engineering / Technology / Semiconductor device fabrication / Rogers / Chemical-mechanical planarization

Education related articles Wendell, K., Kendall, A., Portsmore, M., Wright, C., Jarvin, L., & Rogers, C[removed]Embedding elementary school science instruction in engineering design problem solving. In S. Purzer, J. Str

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Source URL: www.tufts.edu

Language: English - Date: 2014-12-31 13:12:36
7Science / Multiple patterning / Resist / Wafer / Finite-difference time-domain method / Photolithography / Chemical-mechanical planarization / Semiconductor device fabrication / Physics / Technology

At The Edge EM EXPLORER Simulation of Wafer Topography Effects in Double Patterning Lithography

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Source URL: emexplorer.net

Language: English - Date: 2009-02-15 16:35:45
8Technology / Microelectromechanical systems / Etching / Wafer / Microfabrication / Deep reactive-ion etching / Chemical-mechanical planarization / Thermal oxidation / Silicon on insulator / Semiconductor device fabrication / Materials science / Microtechnology

A new low-temperature high-aspect-ratio MEMS process using plasma activated wafer bonding

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Source URL: deepblue.lib.umich.edu

Language: English - Date: 2013-09-17 15:11:17
9Semiconductor device fabrication / Nanotechnology / Etching / Microelectromechanical systems / Transducers / Surface micromachining / Bulk micromachining / Deep reactive-ion etching / Chemical-mechanical planarization / Materials science / Microtechnology / Technology

Capabilities Service Details Specific application

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Source URL: www.ipms.fraunhofer.de

Language: English - Date: 2015-01-15 19:37:11
10Microtechnology / Chemical-mechanical planarization / Etching / Back end of line / Copper interconnect / Through-silicon via / Wafer / Chemical vapor deposition / Three-dimensional integrated circuit / Semiconductor device fabrication / Electronics / Technology

Robust TSV Via­Middle and Via­Reveal Process Integration Accomplished through Characterization and Management of Sources of Variation

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Source URL: www.appliedmaterials.com

Language: English - Date: 2014-05-27 18:47:55
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